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Structural and electronic analysis of Hf on Si(111) surface studied by XPS, XPD and ARXPS

Structural and electronic analysis of Hf on Si(111) surface studied by XPS, XPD and ARXPS

M. F. Carazzolle, M. Schürmann, C. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G. G. Kleiman, C. Westphal

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Este resumo foi apresentado no evento 10th International Conference on Electronic Spectroscopy and Structure, 2006

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Texto completo:

Structural and electronic analysis of Hf on Si(111) surface studied by XPS, XPD and ARXPS

M. F. Carazzolle, M. Schürmann, C. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G. G. Kleiman, C. Westphal 

										

											
											
										

									

									

										

											

												
Structural and electronic analysis of Hf on Si(111) surface studied by XPS, XPD and ARXPS

											

												

														

		

							

					M. F. Carazzolle, M. Schürmann, C. Flüchter, D. Weier, U. Berges, A. de Siervo, R. Landers, G. G. Kleiman, C. Westphal
				

		

	


												

										

										
    
										
    
											
										
    
									
    
								
    
							
    
						
    
					
    
				
    
			
    
		
    
	
    
	

    

	

		
    
			
    
				
    
					
    
								
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Journal of electron spectroscopy and related phenomena (Fonte avulsa)