Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans
Adenilson O. dos Santos, Rossano Lang, José M. Sasakic and Lisandro P. Cardoso
ARTIGO
Inglês
Agradecimentos: The authors would like to thank the LNLS staff and Dr Marcus A. R. Miranda. The following funding is acknowledged: Conselho Nacional de Desenvolvimento Científico e Tecnológico (grant No. 420850/2018-0); Fundação de Amparo à Pesquisa do Estado de São Paulo (grant No. 07/08609-3)
Abstract: This paper reports the successful extension of the basis of the X-ray multiple diffraction phenomenon in the assessment of structural phase transitions and the determination of thermal expansion coefficients along three crystallographic directions, using synchrotron radiation Renninger...
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Abstract: This paper reports the successful extension of the basis of the X-ray multiple diffraction phenomenon in the assessment of structural phase transitions and the determination of thermal expansion coefficients along three crystallographic directions, using synchrotron radiation Renninger scans. Suitable simultaneous four-beam cases have accurately resolved the lattice-parameter variation in a nearly perfect single-crystal Rochelle salt using a high-stability temperature apparatus. Secondary reflections observed in the Renninger patterns, chosen by their sensitivity to the shifts in angular position as a function of temperature, have allowed the detection of a monoclinic to orthorhombic phase transition, as well as subtle expansions of all the basic lattice parameters, i.e. without having to carry out measurements on each crystal axis. The thermal expansion coefficients have been estimated from the linear fit of the temperature dependence of the lattice parameters, and are in agreement with those reported in the literature
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CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ
420850/2018-0
FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP
07/08609-3
Fechado
Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans
Adenilson O. dos Santos, Rossano Lang, José M. Sasakic and Lisandro P. Cardoso
Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans
Adenilson O. dos Santos, Rossano Lang, José M. Sasakic and Lisandro P. Cardoso
Fontes
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Journal of applied crystallography (Fonte avulsa) |