Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry

Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry

Redouane Zemmamouche, Jean-François Vandenrijt, Aïcha Medjahed, Ivan de Oliveira, Marc P. Georges

ARTIGO

Inglês

Agradecimentos: Redouanne Zemmamouche would like to acknowledge the Ministry of Higher Education and Scientific Research of Algeria, the University of M’SILA, and the Institut National d’Optique et Mécanique de Precision of Sétif University for providing the grant for h

Electronic speckle pattern interferometry (ESPI) is combined with digital speckle photography (DSP) to measure out-of-plane deformation in the presence of large in-plane translation or rotation. ESPI is used to measure out-of-plane displacements smaller t

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Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry

Redouane Zemmamouche, Jean-François Vandenrijt, Aïcha Medjahed, Ivan de Oliveira, Marc P. Georges


										

Use of specklegrams background terms for speckle photography combined with phase-shifting electronic speckle pattern interferometry

Redouane Zemmamouche, Jean-François Vandenrijt, Aïcha Medjahed, Ivan de Oliveira, Marc P. Georges

    Fontes

    Optical engineering

    Vol. 54, no. 8 (Aug., 2015), n. art. 084110