Dielectric properties characterization : a simple inverse problem approach

Dielectric properties characterization : a simple inverse problem approach

Leandro A. C. Fonseca, Hugo E. Hernandez-Figueroa, Gilberto T. Santos-Souza, Leonardo L. Bravo-Roger

ARTIGO

Inglês

Agradecimentos: This work was supportted by CNPq, CAPES and FAPESP, Brazil. The authors are grateful to Edson Reis (BRADAR, Brazil) for providing the dielectric samples.

A non-resonating technique for characterizing isotropic complex permittivity of dielectric substrates is presented. The technique is applicable to high or low ε r and tan δ values. After measuring the S 21 of a microstrip line with the unknown substrate,

CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ

FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP

COORDENAÇÃO DE APERFEIÇOAMENTO DE PESSOAL DE NÍVEL SUPERIOR - CAPES

Fechado

Dielectric properties characterization : a simple inverse problem approach

Leandro A. C. Fonseca, Hugo E. Hernandez-Figueroa, Gilberto T. Santos-Souza, Leonardo L. Bravo-Roger


										

Dielectric properties characterization : a simple inverse problem approach

Leandro A. C. Fonseca, Hugo E. Hernandez-Figueroa, Gilberto T. Santos-Souza, Leonardo L. Bravo-Roger

    Fontes

    2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications (NEMO)

    (July, 2017), p. 22-24