Dielectric properties characterization : a simple inverse problem approach
ARTIGO
Inglês
Agradecimentos: This work was supportted by CNPq, CAPES and FAPESP, Brazil. The authors are grateful to Edson Reis (BRADAR, Brazil) for providing the dielectric samples
Abstract: A non-resonating technique for characterizing isotropic complex permittivity of dielectric substrates is presented. The technique is applicable to high or low epsilon(r) and tan delta values. After measuring the S-21 of a microstrip line with the unknown substrate, an inverse problem is...
Abstract: A non-resonating technique for characterizing isotropic complex permittivity of dielectric substrates is presented. The technique is applicable to high or low epsilon(r) and tan delta values. After measuring the S-21 of a microstrip line with the unknown substrate, an inverse problem is built with an EM solver. Then, the complex permittivity parameters are extracted by means of solving the inverse problem using the Differential Evolution algorithm. The validity of the technique is assessed by characterizing two known and reliable dielectrics, in which the maximum error for the epsilon(r) and tan delta was 7.6% and 16.67%, respectively
CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ
FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP
COORDENAÇÃO DE APERFEIÇOAMENTO DE PESSOAL DE NÍVEL SUPERIOR - CAPES
Fechado
DOI: https://doi.org/10.1109/NEMO.2017.7964174
Texto completo: https://ieeexplore.ieee.org/document/7964174
Dielectric properties characterization : a simple inverse problem approach
Dielectric properties characterization : a simple inverse problem approach
Fontes
|
Proceedings of the 2017 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization for RF, Microwave, and Terahertz Applications Piscataway, NJ : Institute of Electrical and Electronics Engineers, 2017. |