Investigation of the internal chemical composition of chitosan-based LbL films by depth-profiling X-ray photoelectron spectroscopy (XPS) analysis

Investigation of the internal chemical composition of chitosan-based LbL films by depth-profiling X-ray photoelectron spectroscopy (XPS) analysis

Thiago B. Taketa, Danilo M. dos Santos, Anderson Fiamingo, Juliana M. Vaz, Marisa M. Beppu, Sergio P. Campana-Filho, Robert E. Cohen, Michael F. Rubner

ARTIGO

Inglês

Chitosan-based thin films were assembled using the layer-by-layer technique, and the axial composition was accessed using X-ray photoelectron spectroscopy with depth profiling. Chitosan (CHI) samples possessing different degrees of acetylation () and molecular weight () produced via the...

CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ

FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP

Fechado

Investigation of the internal chemical composition of chitosan-based LbL films by depth-profiling X-ray photoelectron spectroscopy (XPS) analysis

Thiago B. Taketa, Danilo M. dos Santos, Anderson Fiamingo, Juliana M. Vaz, Marisa M. Beppu, Sergio P. Campana-Filho, Robert E. Cohen, Michael F. Rubner


										

Investigation of the internal chemical composition of chitosan-based LbL films by depth-profiling X-ray photoelectron spectroscopy (XPS) analysis

Thiago B. Taketa, Danilo M. dos Santos, Anderson Fiamingo, Juliana M. Vaz, Marisa M. Beppu, Sergio P. Campana-Filho, Robert E. Cohen, Michael F. Rubner

    Fontes

    Langmuir: the ACS journal of surfaces and colloids

    Vol. 34, no. 4 (2018), p. 1429-1440