Agradecimentos: The authors would like to thank the Brazilian National Nanotechnology Laboratory (LNNano) for technical support during electron microscopy work (project ME22332) and X-ray diffraction experiments. The atomic force microscope was funded by FAPESP (Project No. 2012/51198-2). F. R. E....

Agradecimentos: The authors would like to thank the Brazilian National Nanotechnology Laboratory (LNNano) for technical support during electron microscopy work (project ME22332) and X-ray diffraction experiments. The atomic force microscope was funded by FAPESP (Project No. 2012/51198-2). F. R. E. acknowledges fellowship from CAPES (88887.149376/2017-00). L. G. M. M acknowledges fellowship from FAPESP (2015/15787-1). F. L. A. V. acknowledges fellowship from CAPES (88887.145777/2017-00). J. C. C. acknowledges CNPq support under project 309354/2015-9

Abstract: Pulsed laser deposition is widely used to grow BaTiO3 thin films. We investigated the influence of oxygen pressure during growth on the topography, microstructure, and roughness of ferroelectric epitaxial BaTiO3 thin films. It also presented an analysis of the epitaxial growth mode and...

Abstract: Pulsed laser deposition is widely used to grow BaTiO3 thin films. We investigated the influence of oxygen pressure during growth on the topography, microstructure, and roughness of ferroelectric epitaxial BaTiO3 thin films. It also presented an analysis of the epitaxial growth mode and defects throughout the film thickness using aberration-corrected transmission electron microscopy. Although ferroelastic (twin boundary) domain walls are absent, several misfit dislocations were observed and might be the primary cause of the observed island growth mode

FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULO - FAPESP

2012/51198-2; 2015/15787-1

COORDENAÇÃO DE APERFEIÇOAMENTO DE PESSOAL DE NÍVEL SUPERIOR - CAPES

88887.149376/2017-00; 88887.145777/2017-00

CONSELHO NACIONAL DE DESENVOLVIMENTO CIENTÍFICO E TECNOLÓGICO - CNPQ

309354/2015-9

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