Please use this identifier to cite or link to this item:
Type: Artigo de periódico
Title: Measurement Of Critical Angle In Sstds
Author: Marques A.
Serra D.A.B.
Abstract: A method of measurement of critical angles of etching is described, relying upon the distortion caused in the shape of the distribution in the number of etched tracks of ions emitted from a 'point-like' source. The method is applied to quartz and mica samples. © 1984.
Citation: Nuclear Tracks And Radiation Measurements (1982). , v. 9, n. 2, p. 143 - 147, 1984.
Rights: fechado
Identifier DOI: 10.1016/0735-245X(84)90033-4
Date Issue: 1984
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
File SizeFormat 
2-s2.0-0021544815.pdf380.38 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.