Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/98641
Type: Artigo de periódico
Title: Measurement Of Critical Angle In Sstds
Author: Marques A.
Serra D.A.B.
Abstract: A method of measurement of critical angles of etching is described, relying upon the distortion caused in the shape of the distribution in the number of etched tracks of ions emitted from a 'point-like' source. The method is applied to quartz and mica samples. © 1984.
Citation: Nuclear Tracks And Radiation Measurements (1982). , v. 9, n. 2, p. 143 - 147, 1984.
Rights: fechado
Identifier DOI: 10.1016/0735-245X(84)90033-4
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0021544815&partnerID=40&md5=8acb435fb22c404a3d2dc391c7603d11
Date Issue: 1984
Appears in Collections:Unicamp - Artigos e Outros Documentos

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