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|Type:||Artigo de periódico|
|Title:||DEPTH PROFILE OF FERROMAGNETIC LAYERED SAMPLES STUDIED WITH PHOTOTHERMALLY MODULATED MAGNETIC-RESONANCE|
|Abstract:||Depth profile analysis of a ferromagnetic layered sample composed of gamma-Fe2O3 and CrO2 tapes were performed with photothermally modulated ferromagnetic resonance (PM-FMR). Those analysis were done by using phase-resolved and modulation frequency variation methods. The experiments showed the advantages of this technique over the conventional one. The dependency of the detected signal on the modulation frequency was also studied for single layer samples, thus determining the microwave-absorbing layer thickness of the tapes.|
|Editor:||Edp Sciences S A|
|Citation:||Journal De Physique Iv. Edp Sciences S A, v. 4, n. C7, n. 667, n. 670, 1994.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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