Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/75999
Type: Artigo de periódico
Title: A LASER-BEAM DEFLECTION SYSTEM FOR MEASURING STRESS VARIATIONS IN THIN-FILM ELECTRODES
Author: SAHU, SN
SCARMINIO, J
DECKER, F
Editor: Electrochemical Soc Inc
Citation: Journal Of The Electrochemical Society. Electrochemical Soc Inc, v. 137, n. 4, n. 1150, n. 1154, 1990.
Rights: aberto
Identifier DOI: 10.1149/1.2086618
Date Issue: 1990
Appears in Collections:Unicamp - Artigos e Outros Documentos

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