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Type: Artigo de periódico
Title: Charge-carrier diffusion length in photorefractive crystals computed from the initial hologram phase shift
Author: Freschi, AA
Garcia, PM
Frejlich, J
Abstract: The plane shift between the pattern of light onto a photorefractive crystal and the resulting hologram at the very beginning of the recording process in two-wave mixing is analyzed and measured as a function of the applied electric field. These data allow one to compute the diffusion length of photoexcited charge carriers and to evaluate the actual electric field inside the crystal. A diffusion length of 0.14 mu m is measured in a nominally undoped photorefractive Bi12TiO20 crystal using a 532 nm wavelength laser illumination, in agreement with results obtained from other methods. (C) 1997 American Institute of Physics. [S0003-6951(97)02243-2].
Editor: Amer Inst Physics
Citation: Applied Physics Letters. Amer Inst Physics, v. 71, n. 17, n. 2427, n. 2429, 1997.
Rights: aberto
Identifier DOI: 10.1063/1.120116
Date Issue: 1997
Appears in Collections:Unicamp - Artigos e Outros Documentos

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