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Type: Artigo de periódico
Title: Three-dimensional mapping of the strain anisotropy in self-assembled quantum-wires by grazing incidence x-ray diffraction
Author: Gutierrez, HR
Magalhaes-Paniago, R
Bortoleto, JRR
Cotta, MA
Abstract: Three-dimensional strain mapping of InAs self-assembled nanowires on an InP substrate using grazing incidence x-ray diffraction is reported. A remarkable anisotropy was observed for the strain components, parallel [-220] and perpendicular [220] to the wire axis. The highest strain relaxation was measured along the [220] direction. The relationship between the interatomic distances along the [-220] and [220] directions, for each z position (height) in the nanostructure, was obtained by angular scans in the vicinity of the (040) reciprocal lattice point. (C) 2004 American Institute of Physics.
Country: EUA
Editor: Amer Inst Physics
Citation: Applied Physics Letters. Amer Inst Physics, v. 85, n. 16, n. 3581, n. 3583, 2004.
Rights: aberto
Identifier DOI: 10.1063/1.1808493
Date Issue: 2004
Appears in Collections:Unicamp - Artigos e Outros Documentos

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