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Type: Artigo
Title: Automated self-assembly and electrical characterization of nanostructured films
Author: Hensel, R. C.
Rodrigues, K. L.
Pimentel, V. D.
Riul, A.
Rodrigues, V.
Abstract: Significant progress in nanoscience was achieved through the development of methods and instruments to better comprehend nanoscale properties. We present here a methodology and automated setup to measure layer-by-layer films capacitance in the air immediately after polyelectrolytes adsorption. It presents high accuracy (similar to 0.01 pF) to check the capacitance stabilization during spontaneous drying process in the air, with sensitivity to show electrical signal alternation accordingly to the outermost polyelectrolyte layer. Besides, a linear trend in capacitance was observed similar to UV-vis measurements. This method allows analyzing films electrical properties, affording better choice of materials, thickness, and molecular architecture.
Subject: Filmes finos
Filmes finos multifolhados
Thin films
Thin films, Multilayered
Country: Estados Unidos
Editor: Cambridge University Press
Rights: fechado
Identifier DOI: 10.1557/mrc.2018.47
Date Issue: 2018
Appears in Collections:IFGW - Artigos e Outros Documentos

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