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PreviewIssue DateTitleAuthor(s)AdvisorType
2007Surface composition and structure of nickel ultra-thin films deposited on Pd(111)Carazzolle, M. F.; Maluf, S. S.; Siervo, A. de; Nascente, P. A. P.; Landers, R.; Kleiman, G. G.-Artigo
2006Hafnium silicide formation on Si(100) upon annealingSiervo, A. de; Flüchter, C. R.; Weier, D.; Schürmann, M.; Dreiner, S.; Westphal, C.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.-Artigo
2008Crystallographic structure of ultra-thin films of Pd on Ni(1 1 1) and Ni on Pd(1 1 1) studied by photoelectron diffractionNascente, P. A. P.; Carazzolle, M. F.; Siervo, A. de; Maluf, S. S.; Landers, R.; Kleiman, G. G.-Artigo
2004XPS and XAES study of Ag-Pd and Cu-Ni alloys: spectra, shifts and electronic structure informationBarbieri, P. F.; Siervo, A. de; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.-Artigo
2007Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPDCarazzolle, M. F.; Schurmann, M.; Fluchter, C. R.; Weier, D.; Berges, U.; Siervo, A. de; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2006Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0)Weiera, D.; Flüchtera, C.; Siervo, A. de; Schürmann, M.; Dreiner, S.; Berges, U.; Carazzolle, M. F.; Pancotti, A.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2006Structure analysis of the system Hafnium/Silicon(1 0 0) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD)Flüchter, C. R.; Siervo, A. de; Weier, D.; Schürmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo
2005Photoelectron diffraction studies of Cu on Pd(111) random surface alloysSiervo, A. de; Soares, E. A.; Landers, R.; Kleiman, G. G.-Artigo
2002Pd on Cu(1 1 1) studied by photoelectron diffractionSiervo, A. de; Soares, E. A.; Landers, R.; Fazan, T. A.; Morais, J.; Kleiman, G. G.-Artigo
2007Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(1 0 0) using Mg K? radiation and synchrotron lightFluchter, C. R.; Siervo, A. de; Weier, D.; Schurmann, M.; Berges, U.; Dreiner, S.; Carazzolle, M. F.; Landers, R.; Kleiman, G. G.; Westphal, C.-Artigo