Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/197656
Type: Artigo de periódico
Title: Effect Of Photoactivation Systems And Resin Composites On The Microleakage Of Esthetic Restorations.
Author: Cavalcante, Larissa Maria Assad
Peris, Alessandra Resende
Ambrosano, Glaucia Maria Bovi
Ritter, Andre Vicente
Pimenta, Luiz Andre Freire
Abstract: The aim of this study was to evaluate the influence of four photoactivation systems [quartz tungsten halogen (QTH), light-emitting diode (LED), argon ion laser (AL), and plasma arc curing PAC)] on cementum/dentin and enamel microleakage of Class II restorations using a microhybrid [Z250-3M ESPE] and two packable composites [(SureFil-Dentsply and Tetric Ceram HB-Ivoclair/Vivadent]. Three hundred sixty vertical-slot Class II cavities were prepared at the mesial surface of bovine incisors using a 245 carbide bur in a highspeed handpiece. Specimens were divided into twelve groups (composite-photoactivation systems). Half of the specimens had the gingival margin placed in enamel (n=15) and the other half in cementum/dentin (n=15). Composites were inserted and cured in 2 mm increments according to manufacturers' recommended exposure times. After polishing, the samples were immersed in 2% methylene blue solution, sectioned, and evaluated at the gingival margins. Data were submitted to statistical analysis using the Kruskal-Wallis and Mann-Whitney tests. No significant differences were found among the photoactivation systems and among resin composites (p>0.05). Microleakage was not significantly affected by location (enamel vs. cementum/dentin, p>0.05). These findings suggested neither the photoactivation systems nor the resin composite types might have an effect on the microleakage at gingival margins Class II cavities.
Subject: Animals
Cattle
Composite Resins
Dental Cavity Preparation
Dental Equipment
Dental Leakage
Dental Marginal Adaptation
Dental Restoration, Permanent
Halogens
Lasers
Light
Phase Transition
Random Allocation
Semiconductors
Statistics, Nonparametric
Xenon
Citation: The Journal Of Contemporary Dental Practice. v. 8, n. 2, p. 70-9, 2007.
Rights: fechado
Address: http://www.ncbi.nlm.nih.gov/pubmed/17277829
Date Issue: 2007
Appears in Collections:Unicamp - Artigos e Outros Documentos

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