Browsing by Author CISNEROS, JI

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Showing results 1 to 10 of 10
PreviewIssue DateTitleAuthor(s)AdvisorType
1995ELECTROCHROMIC BEHAVIOR OF SPUTTERED TITANIUM-OXIDE THIN-FILMSCANTAO, MP; CISNEROS, JI; TORRESI, RM-Artigo de periódico
1994KINETIC-STUDY OF LITHIUM ELECTROINSERTION IN TITANIUM-OXIDE THIN-FILMSCANTAO, MP; CISNEROS, JI; TORRESI, RM-Artigo de periódico
1984DOPING EFFECTS IN OFF-STOICHIOMETRIC GLOW-DISCHARGE AMORPHOUS-SILICON NITRIDEALVAREZ, F; CHAMBOULEYRON, I; CONSTANTINO, C; CISNEROS, JI-Artigo de periódico
1981ON THE COLOR VARIATION OF A CALCIUM ALUMINATE GLASSARGUELLO, ZP; BILAC, SA; CISNEROS, JI; TOMYIAMA, M; DONOSO, P; MIRANDA, LCM-Artigo de periódico
1994ELECTRONIC-STRUCTURE OF AMORPHOUS SI-N COMPOUNDSGURAYA, MM; ASCOLANI, H; ZAMPIERI, G; DASILVA, JHD; CANTAO, MP; CISNEROS, JI-Artigo de periódico
1995EFFECT OF DEVIATION FROM STOICHIOMETRY AND THERMAL ANNEALING ON AMORPHOUS GALLIUM ANTIMONIDE FILMSDASILVA, JHD; CISNEROS, JI; GURAYA, MM; ZAMPIERI, G-Artigo de periódico
1987TEMPERATURE EFFECTS ON THE OPTICAL-PROPERTIES OF AMORPHOUS HYDROGENATED SILICON NITROGEN ALLOYS PREPARED BY RF SPUTTERINGBERGER, JM; ANCE, C; DECHELLE, F; FERRATON, JP; DONNADIEU, A; CISNEROS, JI; DASILVA, JHD-Artigo de periódico
1983A METHOD FOR THE DETERMINATION OF THE COMPLEX REFRACTIVE-INDEX OF NON-METALLIC THIN-FILMS USING PHOTOMETRIC MEASUREMENTS AT NORMAL INCIDENCECISNEROS, JI; REGO, GB; TOMYIAMA, M; BILAC, S; GONCALVES, JM; RODRIGUEZ, AE; ARGUELLO, ZP-Artigo de periódico
1990BOND DENSITIES AND ELECTRONIC-STRUCTURE OF AMORPHOUS SINX-HGURAYA, MM; ASCOLANI, H; ZAMPIERI, G; CISNEROS, JI; DASILVA, JHD; CANTAO, MP-Artigo de periódico
1981THE INFLUENCE OF H2O2 ON THE CRYSTALLINE ORIENTATION OF CHEMICALLY DEPOSITED PBS THIN-FILMSTORRIANI, IC; TOMYIAMA, M; BILAC, S; REGO, GB; CISNEROS, JI; ARGUELLO, ZP-Artigo de periódico